Welcome to Logic2Day, your news source for everything embedded.
Datalight introduces: FlashFX Tera and Reliance Nitro
Posted on Wednesday, July 15, 2009 by Datalight Product Management at Logic Technology
Intelligent Flash Media Manager with Support for MLC
Datalight FlashFX Tera is an intelligent flash media manager (block device driver) for embedded devices using resident flash memory for mass storage.
Fault-tolerant performance file system for rapid development of reliable devices
Datalight Reliance Nitro is an embedded file system designed for products running any 32-bit oprating system. more
ScanWorks Non Instructive Board Test is the answer!
Posted on Wednesday, July 15, 2009 by ASSET InterTech product managament at Logic Technology
Restricted test access on today's PCBs requires non-intrusive board test (NBT) methods, such as ASSET's market-leading ScanWorks Boundary-Scan Test solutions. But boundary scan alone can't fully address emerging technologies so ASSET has added innovative NBT tools to the ScanWorks platform: Processor-Controlled Test, Intel® IBIST and Core Instrumentation. Read more >>
Using static analysis tools to uncover potential flaws
Posted on Wednesday, July 15, 2009 by GrammaTech product management at Logic Technology
The Center for Devices and Radiological Health (CDRH) at the FDA is responsible for post-market surveillance of medical devices. If a device failure resulting in actual or potential serious injury or death is reported, the manufacturer of the medical device is required to... Read more >>
Posted on Tuesday, June 23, 2009 by ASSET InterTech Pressroom
The ScanWorks® Processor-Controlled Test solution, known as MicroMaster, is a test and debug solution for assembled boards (PCBAs) that are controlled by a processor.
For those of you who are new to PCT there is another technology overview available on the new ASSET InterTech website.
Although this video focusses on our support for the entire Intel architecture the PCT tester is available for various popular processor architectures.
ASSET InterTech university offers a variety of boundary-scan Test technology, design for test and boundary-scan methodology classes. Contact us for more information.
Posted on Tuesday, June 23, 2009 by ASSET InterTech Pressroom
ScanWorks® Boundary Scan tools release 3.11.0 is available for download
- Improved speed of Netlist Merging
- The RIC-1000 remote controller now supports Boundary-scan structural test and CPU Functional test actions
- NAND Flash Model Improvements
Intel® IBIST 2.1.5.0 released
Improved functionality.
Contact André De Ceuninck, Product Manager Test Solutions at Logic Technology, if you need assitance to install or configure the new software.
ASSET ScanWorks platform is first to support both!
Posted on Monday, June 22, 2009 by ASSET InterTech Pressroom
Nehalem microarchitecture with QuickPath Interconnect can be validated and tested with ScanWorks® Intel® IBIST® and processor-controlled test.
ASSET® InterTech's ScanWorks® platform for embedded instrumentation is the first in the industry to support both signal integrity design validation and circuit board test for the new Intel® Xeon® processor 5500 series, codenamed Nehalem, as well as the 5520 chipset. Xeon 5500 series processors will be deployed in systems using Intel's QuickPath Interconnect (QPI) platform architecture. more
Interview with Glenn Woppman, ASSET InterTech
Posted on Monday, June 22, 2009 by ASSET InterTech Press Room
“We are really trying to make an impact over the entire life cycle of a chip, board, and system by reusing embedded instruments from chip design all the way through the system-integration phases and out into field service.”
Read the complete interview with EDN Innovator of the Year finalist Glenn Woppman in EDN Magazine.
Posted on Monday, June 22, 2009 by ASSET InterTech Press Room
The industry has been chasing Moore's law for many years now and no one wants to be blamed for breaking the streak. But packing transistors into silicon is one thing; validating designs, performing tests and doing debug are quite another. A panel at the recent DesignCon conference highlighted the mounting desperation of many who grapple with high-end design and test issues every day. Fortunately, non-intrusive tools are a big part of the solution and they're here today. read more
Posted on Wednesday, June 03, 2009 by Logic Pressroom
Join our 30 minute technical webinar on June 10, 11 a.m. CEST.
During this webinar, you will learn about the Keil Microcontroller Development Tools for developing embedded applications. The session will cover:
- The µVision IDE, including the new features for enhanced productivity in µVision4
- Creating and debugging applications using the MDK-ARM Microcontroller Development Kit
- Tools for analyzing and optimizing applications on target hardware
more
Contact 
µVision4 info webinar info
Posted on Tuesday, June 02, 2009 by CMX adds Kernel Awareness for RTOS in MDK-ARM
CMX Systems is pleased to announce the availability of its CMXKAware kernel awareness for its CMX-RTX and CMX-
Tiny+ Real Time Operating Systems when used with the Keil MDK-ARM Microcontroller Development Kit.... more